| 摘要 |
<p>An apparatus and method for the processing of height information indicative of the roughness or texture of a surface which may be used to produce an improved two dimensional recording of the surface. The apparatus or method has particular applicability in the field on metrological instruments. In processing the surface information, the apparatus or method takes account not only of the basic height information but also of gradient information. Such gradient information is furthermore adjusted dependent upon a desired angle of illumination which may be selected by the user. <IMAGE> <IMAGE></p> |
