发明名称 |
SPUTTERING TARGET, HALFTONE PHASE SHIFT MASK AND BLANK |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a sputtering target which is used for the manufacture of a halftone phase shift mask and a blank and which does not produce particle defects during depositing a film. SOLUTION: The sputtering target is an alloy composed of two or more kinds of elements, and the alloy is not a compound of these elements. The alloy is a eutectic alloy. One of the two or more elements is Si. The above sputtering target is used to produce a halftone phase shift mask and a blank.</p> |
申请公布号 |
JP2003140315(A) |
申请公布日期 |
2003.05.14 |
申请号 |
JP20010337761 |
申请日期 |
2001.11.02 |
申请人 |
TOPPAN PRINTING CO LTD |
发明人 |
HARAGUCHI TAKASHI;MATSUO TADASHI |
分类号 |
C23C14/34;G03F1/32;G03F1/68;H01L21/027;(IPC1-7):G03F1/08 |
主分类号 |
C23C14/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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