发明名称 SPUTTERING TARGET, HALFTONE PHASE SHIFT MASK AND BLANK
摘要 <p>PROBLEM TO BE SOLVED: To provide a sputtering target which is used for the manufacture of a halftone phase shift mask and a blank and which does not produce particle defects during depositing a film. SOLUTION: The sputtering target is an alloy composed of two or more kinds of elements, and the alloy is not a compound of these elements. The alloy is a eutectic alloy. One of the two or more elements is Si. The above sputtering target is used to produce a halftone phase shift mask and a blank.</p>
申请公布号 JP2003140315(A) 申请公布日期 2003.05.14
申请号 JP20010337761 申请日期 2001.11.02
申请人 TOPPAN PRINTING CO LTD 发明人 HARAGUCHI TAKASHI;MATSUO TADASHI
分类号 C23C14/34;G03F1/32;G03F1/68;H01L21/027;(IPC1-7):G03F1/08 主分类号 C23C14/34
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