| 摘要 |
PURPOSE: A probe card for testing an LCD is provided to make the device slim by reducing the thickness of a guide plate and a needle plate fitted to the guide plate. CONSTITUTION: A probe card for testing an LCD has an assembly holder(10), a board holder(20) fitted to the one-sided bottom portion of the assembly holder(10), and a needle holder(30) fitted to the other-sided bottom portion of the assembly holder(10). A circuit board(40) is attached to the bottom of the board holder(20) with drive ICs. A guide plate(50) is attached to the bottom of the needle holder(30) with a plurality of needle insertion grooves(51). A needle plate(60) is fitted to the guide plate(50) by way of the needle insertion grooves(51).
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