Method for testing a semiconductor integrated circuit

摘要

In a method of testing a semiconductor integrated circuit, an input signal is supplied to a logic circuit of the semiconductor integrated circuit. Current from a static power source passing through the semiconductor integrated circuit is repeatedly meansured while a logic state of the semiconductor integrated circuit is sequentially changed. Maximum and minimum currents are selected from the measured currents and an average current calculated from the measured currents. A determination is made that the semiconductor integrated circuit is defective when either of the difference between the average and maximum currents or the difference between the average and minimum currents exceeds a threshold value.