发明名称 Advanced production test method and apparatus for testing electronic devices
摘要 An advanced process for moving a Device under Test (DUT) from surface mount to completion and shipping. The process takes a raw populated Printed Circuit Board (PCB) panel or similar article of manufacture and conducts all possible solder, electrical, boundary scan and flashed self-testing. Individual panels are routed out of larger panels and placed into basic electronic device chassis on a motorized and power delivering fixture carrying a fixture adapter to interface with the electronic device. Power is provided as soon as is feasible in order to leverage the DUTs ability to facilitate it's own functional certification. Without power, the "wake-up" time for an electronic device may be extensive. Additionally, the addition of power would otherwise have to be done numerous times throughout the process. Conditions for impending measurement can be set up on a powered electronic device so that measurements may be made the moment the testing instrumentation is ready to take measurements.
申请公布号 US6563301(B2) 申请公布日期 2003.05.13
申请号 US20010845912 申请日期 2001.04.30
申请人 NOKIA MOBILE PHONES LTD. 发明人 GVENTER BRIAN
分类号 G01R31/28;H04M1/24;(IPC1-7):G01R31/02 主分类号 G01R31/28
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