发明名称 |
System and method for controlling a polishing machine |
摘要 |
A system for controlling a polishing machine during polishing of a workpiece, such as a semiconductor wafer, includes a carrier which has an interface surface for engaging a workpiece and establishing ultrasonic coupling thereto. At least one crystal oscillator is ultrasonically coupled to the carrier and operates at a resonant frequency in an ultrasonic band which is indicative of a desired polishing depth of the workpiece, such as the endpoint of polishing. A detector circuit provides an output signal which is representative of an output level of the crystal oscillator. A processor circuit receives the signal from the detector circuit and provides a signal to the polishing machine when the amplitude of the signal from the detector circuit indicates that the desired polishing endpoint has been reached. A number of crystal oscillators can be spatially arranged on the carrier to establish a local polishing depth detection array.
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申请公布号 |
US6561868(B1) |
申请公布日期 |
2003.05.13 |
申请号 |
US20000727187 |
申请日期 |
2000.11.30 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
EDWARDS HENRY LITZMANN;FANG SUNG-JEN;MOORE THOMAS M. |
分类号 |
B24B37/04;B24B49/10;(IPC1-7):B24B49/00 |
主分类号 |
B24B37/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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