Method and apparatus for storing and using chipset built-in self-test signatures

摘要

A method and apparatus for storing and using chipset built-in self-test (BIST) signatures is provided. A BIST for a chip in a data processing system may be initiated by a power-on-reset in the data processing system. The BIST signature generated during the BIST is compared with a predetermined BIST signature stored in a vital products data (VPD) module associated with the chip is read. A difference between the generated BIST signature and the predetermined BIST signature is then reported.