| 摘要 |
PURPOSE: A tray insertion apparatus of a semiconductor device test handler is provided to smoothly implement the tray movement work at a test site in the handlers designed in such a way that each of the chambers has a different interval by inserting the test tray firstly moved to one side of the chamber by the test tray to the desired position of the inner side of the chamber, thereby improving the efficiency of test. CONSTITUTION: A tray insertion apparatus of a semiconductor device test handler includes a fixed block(101) between the second chamber and the third chamber with maintaining the height thereof to those of the upper and lower of the guide rail, a stop latch(102) installed with facing to the test tray of the fixed block(101) in such a way that the stop latch(102) is elastically and rotatably moved to the moving direction of the test tray and supports the rear edge of the tray moved into the third chamber, a moving block(104) installed in such a way that the moving block(104) moves horizontally in the third chamber, a movable latch(105) installed with facing to the test tray of the moving block(104) and supports the rear edge of the test tray moved into the third chamber and a driving member for driving the moving block(104) to a predetermined distance from the position of the fixed block(101) into the third chamber. |
