SUB-LANCE PROBE WITHDRAWING APPARATUS WITH FUNCTION FOR REMOVING PROBE CHIPS OF DETACHING PART

摘要

PURPOSE: A sub-lance probe withdrawing apparatus with function for removing probe chips of detaching part is provided to remove probe chip adhered to detaching blades of the detaching part as withdrawing a probe for measuring temperature of molten steel and collecting a sample by being dipped into molten steel in stainless steel refining furnace. CONSTITUTION: The sub-lance probe withdrawing apparatus comprises a unit driving part(50) comprising links that are pin connected to second rod of second driving cylinder movably installed on fixed frame at one side of sub-lance, and detaching arms that are operated by the pantograph principle with the detaching arms being reciprocally alternatingly connected to the end part of the links; a probe detaching part(60) comprising upper supports and lower supports composing the detaching arms of the unit driving part(50), and detaching blades rotationally installed at the upper supports and lower supports; and a chip removal part(70) comprising connectors for clamping connection links axially connected to the outer side of the rotational detaching blades of the probe detaching part(60), operating rods fixed to the central part of the connectors and movably fixed by springs with the detaching arms being penetrated by the operating rods, and scrapers installed at the inner side of the detaching arms with the scrapers being installed adjacently to the detaching blades.