发明名称 SEMICONDUCTOR MEMORY, AND DATA WRITE METHOD FOR SEMICONDUCTOR MEMORY
摘要 <p>PROBLEM TO BE SOLVED: To provide a semiconductor memory in which a required time for data write operation can be suppressed to the minimum even if it is repeated the maximum number of times, and a data write method of the semiconductor memory. SOLUTION: A flash memory 101 is set to a test mode by setting a test pad TP to a L level. When verifying is passed, a verify-circuit VC outputs an adaptation signal VPASS of a H level, but each adaptation signal input terminal (VPASS) of a data write control circuit WCC and a data write counter circuit WCT is fixed to a L level by an adaptation signal invalidating means 3. A latch circuit LC holds a latch adaptation signal VPL at a H level, and a verify-start signal input terminal (VR) of the verify-circuit VC is fixed to a L level. The write-operation requiring no verify-operation is repeated until the number of times of the operations reaches the number of times set to a counter circuit WCT.</p>
申请公布号 JP2003132700(A) 申请公布日期 2003.05.09
申请号 JP20010326635 申请日期 2001.10.24
申请人 OKI ELECTRIC IND CO LTD 发明人 HARA TAKAHITO
分类号 G01R31/28;G01R31/3185;G11C16/02;G11C16/34;G11C17/00;G11C29/12;G11C29/52;(IPC1-7):G11C29/00;G01R31/318 主分类号 G01R31/28
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