APPARATUS FOR CLAMPING TEST TRAY OF SEMICONDUCTOR DEVICE TEST HANDLER

摘要

PURPOSE: An apparatus for clamping a test tray of a semiconductor device test handler is provided to prevent a coupling error between a tray moving device and a test tray generated by an alignment error of a test tray during a test since the test tray is accurately positioned at the assigned position when the test is implemented by one step at the side of the test tray. CONSTITUTION: An apparatus for clamping a test tray of a semiconductor device test handler includes a preheating chamber for heating or cooling the semiconductor devices installed at the test tray at a predetermined temperature, a test chamber(72) for implementing the test installed at one side of the preheating chamber by connecting the semiconductor devices moved from the preheating chamber to the test socket, a defrosting chamber installed at one side of the test chamber for recovering the semiconductor devices of the test tray moved from the test chamber, a guide rail installed in such a way that the guide rail(77) traverse the preheating chamber, the test chamber and the defrosting chamber and a pair of moving devices for horizontally moving the test tray along the guide rail(77).