发明名称 METHOD FOR FABRICATING HETEROSTRUCTURE FIELD EFFECT TRANSISTOR
摘要 PURPOSE: A method for fabricating a hetero structure field effect transistor(HFET) is provided to reduce critical dimension and improve the ordering state of gate electrodes on AlGaN/GaN HFET device by forming gate electrodes before ohmic electrodes. CONSTITUTION: An updoped I-GaN and AlGaN semiconductor layer are deposited sequentially on a substrate. The resultant structure is mesa-etched to divide devices. A photoresist layer pattern is formed on the AlGaN semiconductor layer by image reversal lithography method. A Gate electrode(G) is formed by using the photoresist layer. Surface treatment is done by using ICP. Ohmic electrodes(S,D) are formed on the AlGaN layer.
申请公布号 KR20030034733(A) 申请公布日期 2003.05.09
申请号 KR20010066452 申请日期 2001.10.26
申请人 POSTECH FOUNDATION 发明人 JANG, HO WON;JUN, CHANG MIN;LEE, JONG RAM
分类号 H01L29/737;H01L21/335;H01L29/20;H01L29/778;(IPC1-7):H01L29/737 主分类号 H01L29/737
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