发明名称 |
METHOD FOR FABRICATING HETEROSTRUCTURE FIELD EFFECT TRANSISTOR |
摘要 |
PURPOSE: A method for fabricating a hetero structure field effect transistor(HFET) is provided to reduce critical dimension and improve the ordering state of gate electrodes on AlGaN/GaN HFET device by forming gate electrodes before ohmic electrodes. CONSTITUTION: An updoped I-GaN and AlGaN semiconductor layer are deposited sequentially on a substrate. The resultant structure is mesa-etched to divide devices. A photoresist layer pattern is formed on the AlGaN semiconductor layer by image reversal lithography method. A Gate electrode(G) is formed by using the photoresist layer. Surface treatment is done by using ICP. Ohmic electrodes(S,D) are formed on the AlGaN layer.
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申请公布号 |
KR20030034733(A) |
申请公布日期 |
2003.05.09 |
申请号 |
KR20010066452 |
申请日期 |
2001.10.26 |
申请人 |
POSTECH FOUNDATION |
发明人 |
JANG, HO WON;JUN, CHANG MIN;LEE, JONG RAM |
分类号 |
H01L29/737;H01L21/335;H01L29/20;H01L29/778;(IPC1-7):H01L29/737 |
主分类号 |
H01L29/737 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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