发明名称 |
Scanning electron microscope Wien filter having support structure around openings with magnetic field generated and electromagnetic field radially extending parts generated and outer magnetic circuit. |
摘要 |
The electromagnetic filter has a structure generating a field around a partial passage (C). A support structure (E) around the passage provides a number of openings (4). Permeable magnetic fields are generated around the openings. Elements (16) generate an electromagnetic field connected to radially extending parts (14). There is a magnetic circuit around the support structure engaging and coupling the extended parts. |
申请公布号 |
FR2831987(A1) |
申请公布日期 |
2003.05.09 |
申请号 |
FR20020013673 |
申请日期 |
2002.10.31 |
申请人 |
SCHLUMBERGER TECHNOLOGIES INC |
发明人 |
DUVAL PAUL J;RUBIN ALLAN I;ROSENBERG IRA;VAYNER VLADIMIR;SULLIVAN NEAL T |
分类号 |
H01J37/256;H01J37/05;H01J37/244;H01J37/28 |
主分类号 |
H01J37/256 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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