发明名称 Scanning electron microscope Wien filter having support structure around openings with magnetic field generated and electromagnetic field radially extending parts generated and outer magnetic circuit.
摘要 The electromagnetic filter has a structure generating a field around a partial passage (C). A support structure (E) around the passage provides a number of openings (4). Permeable magnetic fields are generated around the openings. Elements (16) generate an electromagnetic field connected to radially extending parts (14). There is a magnetic circuit around the support structure engaging and coupling the extended parts.
申请公布号 FR2831987(A1) 申请公布日期 2003.05.09
申请号 FR20020013673 申请日期 2002.10.31
申请人 SCHLUMBERGER TECHNOLOGIES INC 发明人 DUVAL PAUL J;RUBIN ALLAN I;ROSENBERG IRA;VAYNER VLADIMIR;SULLIVAN NEAL T
分类号 H01J37/256;H01J37/05;H01J37/244;H01J37/28 主分类号 H01J37/256
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