SEMICONDUCTOR MEMORY DEVICE HAVING MONITORING CIRCUIT

摘要

PURPOSE: A semiconductor memory device having a monitoring circuit is provided to measure a device characteristic by using a dummy word line and a dummy bit line. CONSTITUTION: A dummy word line is connected with a dummy cell. A dummy bit line is connected with the dummy cell. A dummy word line driver(10) is used for driving the dummy word line. A dummy bit line sense amplifier(20) is used for amplifying data loaded on the dummy bit line. The first comparison portion(30A) compares the voltage applied to the dummy word line with the first reference voltage. The second comparison portion(30B) compares the voltage applied to the dummy bit line with the second reference voltage. The third comparison portion(30C) compares the voltage applied to the dummy bit line with the third reference voltage. A control circuit(40) is used for generating a plurality of control signals to control the voltages of the dummy word line and the dummy bit line.