发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a variable check circuit capable of quickly detecting CPU runaways, etc., without influencing the operations of a CPU. SOLUTION: A latch 101 receives counting values CNT from a program counter 120 for the CPU. A comparison circuit 102 compares the counting values CNT, with the boundary values BDY1 stored into a boundary value storage part 104 and a comparison circuit 103 compares the counting values CNT with boundary values BDY2 stored into a boundary value storage part 105. A gate 108 outputs '0' as a determination signal JDG, when the counting values CNT lie within a range decided by the boundary values BDY1 and BDY2, but otherwise outputs '1'. A gate 109 outputs the determination signal JDG, as it is, or in reverse, according to values stored into a mode graph storage part 106 and a gate 110 outputs the determination signal JDG to the outside, only when values stored into a function valid/invalid flag storage part 107 are '1'.
申请公布号 JP2003131903(A) 申请公布日期 2003.05.09
申请号 JP20010322128 申请日期 2001.10.19
申请人 OKI ELECTRIC IND CO LTD 发明人 OMO HIROYUKI
分类号 G06F11/28;(IPC1-7):G06F11/28 主分类号 G06F11/28
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