发明名称 SEMICONDUCTOR SUBSTRATE PROCESSING TOOL AND FABRICATIONS FACILITIES INTEGRATION PLATE
摘要 An apparatus and method for installing a plurality of facilities conduits in a wafer fabrication facility for subsequent coupling to a wafer-processing tool. The apparatus comprises a facilities integration plate and a gauge fixture removably inserted within the facilities integration plate. The method comprises the steps of determining a location where the wafer-processing tool is positioned in the wafer fabrication facility, forming a cutout in a floor of the fabrication facility, and providing the plurality of facilities conduits through the cutout in the floor. The facilities integration plate is mounted within the cutout in the floor, and the gauge fixture is disposed within the facilities integration plate. The facilities conduits are sized to a length defined by the gauge fixture and the wafer-processing tool is coupled to the plurality of facilities conduits.
申请公布号 KR20030036598(A) 申请公布日期 2003.05.09
申请号 KR20037000313 申请日期 2003.01.09
申请人 发明人
分类号 H01L21/02;H01L21/00 主分类号 H01L21/02
代理机构 代理人
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