发明名称 |
CAPACITOR OF MEMORY SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF |
摘要 |
PURPOSE: A capacitor of a memory semiconductor device is provided to prevent a bottom mold pattern from being etched during eliminating process of a top mold pattern and have a bottom electrode supported safely by the bottom mold pattern. CONSTITUTION: An interlayer dielectric(100) and etch stopping layer(110) are formed in turn on a semiconductor substrate. A contact plug(120) is formed through the resultant structure. A bottom mold pattern(135) and etch stopping pattern(145) are formed on the etch stopping layer, exposing the contact plug. The bottom electrode covers the top surface of the contact plug and the sidewall of the exposed opening of the bottom mold pattern and etch stopping pattern, having cylindrical shape with a bending part on the edge of the etch stopping pattern.
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申请公布号 |
KR20030035631(A) |
申请公布日期 |
2003.05.09 |
申请号 |
KR20010067883 |
申请日期 |
2001.11.01 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
WON, SEOK JUN;YOO, CHA YEONG |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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