发明名称 METHOD AND APPARATUS FOR CONTROLLING CMP PAD SURFACE FINISH
摘要 <p>A method and apparatus for pre-conditioning a polishing pad (12) for use in chemical mechanical planarization of semiconductor wafers is described. The apparatus includes a pre-conditioning member having a smooth surface. The method includes providing a pre-conditioning member (20) having a smooth surface, pressing the pre-conditioning member (20) against the polishing pad (12) while moving the polishing pad (12), and flattening the surface of the polishing pad (12) until a polishing pad flatness is achieved that may be used to achieve a desired semiconductor wafer planarity.</p>
申请公布号 WO2003037566(A1) 申请公布日期 2003.05.08
申请号 US2002031924 申请日期 2002.10.04
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