发明名称 |
Device testing method, involves separating connection between defective device and supply line, then applying test signal on common line to test remaining devices |
摘要 |
The method involves separating a connection between a defective device and the supply line, which are arranged on the wafer and connected to common data lines. Applying a test signal to the common line in order to test the remaining devices. The response signals from the common line are then assessed.
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申请公布号 |
DE10152086(A1) |
申请公布日期 |
2003.05.08 |
申请号 |
DE2001152086 |
申请日期 |
2001.10.23 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
MOECKEL, JENS;FAERBER, GERRIT;FRITZ, MARTIN |
分类号 |
G11C29/00;G11C29/44;H01L21/66;(IPC1-7):H01L21/66 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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