| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem that it can not be easily judged whether switching was actually made to a test mode or not even if a semiconductor storage was set to the test mode. SOLUTION: In the semiconductor storage having a test mode, the semiconductor storage is set to a state that differs from a normal mode when entering the test mode. Then, according to the stage change, it can be verified that the semiconductor storage has entered the test mode. For example, in the test mode, the output of the said device is inverted.
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