SEMICONDUCTOR-TESTING APPARATUS

摘要

PROBLEM TO BE SOLVED: To match the frequency of an analog signal to that of a digital signal to the extent without any practical difficulty. SOLUTION: A reference clock-generating circuit 31 creates a reference clock signal (frequency f1 ) from the output of an oscillator 20. A digital signal system 40 creates a timing signal based on the reference clock signal, and supplies a test signal (frequency ft ) in synchronization with the timing signal to a device 10 to be measured. A strobe-generating circuit 33 has the same resolution as the reference clock-generating circuit 31 and creates a strobe signal (frequency f3 ) from the output of the oscillator 20. A memory 61 in a digitizer 60 fetches the output data (frequency fa ) of the device 10 to be measured in synchronization with the strobe signal from the strobe-generating circuit 33. The frequency of the strobe signal is adjusted by the strobe-generating circuit 33 for matching to the frequency of the output data of the device 10 to be measured.