发明名称 HIGH FREQUENCY SIGNAL ISOLATION IN A SEMICONDUCTOR DEVICE
摘要 A semiconductor device (20) includes an isolated p-well (22) formed in a substrate (21) by a buried n-well (25) and an n-well ring (24). The n-well ring (24) extends from a surface of the semiconductor device (20) to the buried n-well (25). The isolated p-well (22) includes a plurality of n-well plugs (27) extending from the surface of the semiconductor device (20) into the isolated p-well (22) and contacting the buried n-well (25). The plurality of n-well plugs (27) reduces an n-well resistance to provide better noise isolation for high frequency signals.
申请公布号 US2003085432(A1) 申请公布日期 2003.05.08
申请号 US20010003535 申请日期 2001.11.02
申请人 DU YANG;BANERJEE SUMAN KUMAR;THOMA RAINER;DUVALLET ALAIN 发明人 DU YANG;BANERJEE SUMAN KUMAR;THOMA RAINER;DUVALLET ALAIN
分类号 H01L21/761;H01L21/822;H01L21/8238;H01L27/04;H01L27/08;(IPC1-7):H01L29/76;H01L29/94;H01L31/062;H01L31/113;H01L31/119 主分类号 H01L21/761
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