发明名称 |
HIGH FREQUENCY SIGNAL ISOLATION IN A SEMICONDUCTOR DEVICE |
摘要 |
A semiconductor device (20) includes an isolated p-well (22) formed in a substrate (21) by a buried n-well (25) and an n-well ring (24). The n-well ring (24) extends from a surface of the semiconductor device (20) to the buried n-well (25). The isolated p-well (22) includes a plurality of n-well plugs (27) extending from the surface of the semiconductor device (20) into the isolated p-well (22) and contacting the buried n-well (25). The plurality of n-well plugs (27) reduces an n-well resistance to provide better noise isolation for high frequency signals.
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申请公布号 |
US2003085432(A1) |
申请公布日期 |
2003.05.08 |
申请号 |
US20010003535 |
申请日期 |
2001.11.02 |
申请人 |
DU YANG;BANERJEE SUMAN KUMAR;THOMA RAINER;DUVALLET ALAIN |
发明人 |
DU YANG;BANERJEE SUMAN KUMAR;THOMA RAINER;DUVALLET ALAIN |
分类号 |
H01L21/761;H01L21/822;H01L21/8238;H01L27/04;H01L27/08;(IPC1-7):H01L29/76;H01L29/94;H01L31/062;H01L31/113;H01L31/119 |
主分类号 |
H01L21/761 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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