发明名称 Method for fabricating a mask for semiconductor structures
摘要 A mask is fabricated by applying a sacrificial layer on a semiconductor wafer. The sacrificial layer is then processed with the aid of a first and a second lithographic process sequence in order to pattern the sacrificial layer in a first and a second direction. A hard mask layer is subsequently applied in order to completely enclose the patterned sacrificial layer. Finally, the sacrificial layer is then removed from the hard mask layer.
申请公布号 US2003087167(A1) 申请公布日期 2003.05.08
申请号 US20020291070 申请日期 2002.11.08
申请人 POPP MARTIN 发明人 POPP MARTIN
分类号 G03F1/00;G03F9/00;H01L21/302;H01L21/308;H01L21/461;(IPC1-7):G03F9/00 主分类号 G03F1/00
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