发明名称 DEVICE AND PROCESS FOR EVALUATING PLATING SOLUTION, AND DEVICE AND PROCESS FOR MANUFACTURING ELECTRONIC DEVICE
摘要 PROBLEM TO BE SOLVED: To reliably embed a metal film in a concave part for circuit formation on a substrate to be plated through a electroplating. SOLUTION: The electric current that flows in a first working electrode 152 wherein the electrode body part is exposed by a first aperture 152b is determined in a plating solution 161, while the electric current that flows in a second working electrode 153 wherein the electrode body part is exposed by a second aperture 153b is determined in the plating solution 161. Here, the second aperture 153b has a larger area than the first aperture 152b. Next, based on each aperture area and the determined current value, ratio C/A is calculated, wherein C and A are the current densities in the first and second working electrodes 152 and 153, respectively. The ratio C/A is compared to a predetermined value K, and if the ratio C/A is smaller than the predetermined value K, the plating solution 161 is completely or partially exchanged with a new plating solution.
申请公布号 JP2003129298(A) 申请公布日期 2003.05.08
申请号 JP20010318819 申请日期 2001.10.17
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 HIRAO HIDEJI
分类号 G01N27/30;C25D7/12;C25D21/12;C25D21/14;G01N27/416;G01N27/42 主分类号 G01N27/30
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