| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit-testing apparatus and a semiconductor integrated circuit-testing method for quickly and efficiently testing a semiconductor integrated circuit where analog and digital circuits are mixed, and hence for reducing costs required for the test. SOLUTION: The semiconductor integrated circuit-testing apparatus for testing a semiconductor integrated circuit where analog and digital circuits are mixed comprises a plurality of analog measuring systems 40a-40c for testing an analog circuit that is provided in the semiconductor integrated circuit to be tested, a digital measuring system 20 for testing a digital circuit that is provided in the semiconductor integrated circuit, and a pattern decoder circuit 30 for outputting a signal for individually controlling the operation of the plurality of analog measuring systems 40a-40c.
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