发明名称 LAG CORRECTION METHOD FOR X-RAY FLAT PANEL DETECTOR, APPARATUS THEREFOR AND X-RAY INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a lag correction method capable of suitably correcting the lag of the output signal of an X-ray flat panel detector even if the lag changes, and an X-ray detector. SOLUTION: In the lag correction method, a numerical formula model, wherein the lag of the output signal of the X-ray flat panel detector is changed by a change in the change quantity newly collected in the X-ray conversion layer 30 of the X-ray flat panel detector corresponding to the charge quantity collected in the X-ray conversion layer 30 and the charge quantity released from the X-ray conversion layer 30, is constructed and the correction of the lag allowing the output signal to approach the waveform shape similar to that of an input signal is performed based on the numerical formula model. The change of the lag is generated by causal relation such that the lag is changed by the collection/release of charge in the X-ray conversion layer 30 and, since the lag is corrected on the basis of the numerical formula model converted from the causal relation, the lag of the output signal can be corrected suitably.
申请公布号 JP2003130957(A) 申请公布日期 2003.05.08
申请号 JP20010325040 申请日期 2001.10.23
申请人 SHIMADZU CORP 发明人 YAHAGI EIJI
分类号 G01T1/17;A61B6/00;G01T1/20;G01T1/24;G06T1/00 主分类号 G01T1/17
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