发明名称 Lithography system, exposure apparatus and their control method, and device manufacturing method
摘要 A host computer (8) transmits an exposure control instruction for exposure processing to a resist coating apparatus (1). The resist coating apparatus (1) performs pre-processing in accordance with the exposure control instruction transmitted from the host computer (8). Then, the resist coating apparatus (1) extracts parameters necessary for exposure processing from the received exposure control instruction and transmits them together with an exposure preparation start instruction to an exposure apparatus (2). The exposure apparatus (2) performs exposure processing on the basis of the received parameters, generates control data for controlling a development apparatus (5) on the basis of the processing result, and transmits this control data to the development apparatus (5).
申请公布号 US2003084808(A1) 申请公布日期 2003.05.08
申请号 US20020281180 申请日期 2002.10.28
申请人 CANON KABUSHIKI KAISHA 发明人 SUGIURA SATOSHI
分类号 G03F7/30;G03F7/20;H01L21/027;(IPC1-7):B41N3/00;B41M5/00 主分类号 G03F7/30
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