发明名称 Semiconductor device having fuse and its manufacturing method
摘要 <p>A semiconductor device has: a fuse (1) having one end applied with a first voltage, and a MOS transistor (3) having source, gate and drain and a connection point between the other end of the fuse and one of the source and drain, a second voltage lower than the first voltage applied to the other of the source and drain, wherein: the first and second voltages, characteristics of the MOS transistor and a resistance of the fuse are selected so that the fuse can be broken down when a predetermined program voltage is applied to the gate; and the resistance of the fuse is set to such a value that the voltage difference between a voltage at the connection point and the second voltage is lower than a drain voltage of the MOS transistor at which a drain current starts saturating, when the program voltage is applied to the gate.</p>
申请公布号 EP1309002(A2) 申请公布日期 2003.05.07
申请号 EP20020024929 申请日期 2002.11.06
申请人 YAMAHA CORPORATION 发明人 KAMIYA, TAKAYUKI;OMURA, MASAYOSHI
分类号 H01L21/82;H01L23/525;(IPC1-7):H01L23/525 主分类号 H01L21/82
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