发明名称 Breakdown drain extended NMOS
摘要 An MOS device and the method of making the device which includes a semiconductor substrate having a well therein of predetermined conductivity type. A tank having a surface is disposed within the well. The tank has a highly doped region of opposite conductivity type and a lightly doped region of opposite conductivity type between the highly doped region and the surface of tank. The lightly doped region in the tank is doped both the predetermined conductivity type and the opposite conductivity type with a resulting net lightly opposite conductivity type doping. A drain region of opposite conductivity type is disposed in the region of the tank between the highly doped region and the surface and disposed at the surface and a source region of opposite conductivity type is disposed in the well and spaced from the tank. The channel region includes the surface region of the tank between the drain region and the well and the surface region of the well between the source region and the tank, the junction region between the tank and the well having a graded doping level. The predetermined conductivity type is preferably p-type to provide an NMOS transistor.
申请公布号 US6559019(B1) 申请公布日期 2003.05.06
申请号 US20000572785 申请日期 2000.05.17
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 NGUYEN BAOSON
分类号 H01L29/78;(IPC1-7):H01L21/336 主分类号 H01L29/78
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