| 摘要 |
Electronics for a shock-hardened device, in particular a data recorder, incorporating non-volatile memory. The device has the functional elements: a signal conditioning circuit, an oscillator, an analog-to-digital converter (ADC), a field programmable gate array (FPGA), a trigger, and a non-volatile memory incorporating both electrically erasable programmable read only memory (EEPROM) and fast static random access memory (SRAM). As a recorder, the electronics enable efficient and reliable data recording in extreme shock environments, e.g., those involving dynamic testing of weapons such as target penetrating bombs or dual-stage warheads. It also provides for data retention upon loss or shutdown of power to the unit and yields high mean time between failures (MTBF) figures in more benign environments.
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