发明名称 Method of producing a Si-Ge base heterojunction bipolar device
摘要 A method of producing a bipolar transistor includes the step of providing a sacrificial mesa over a layer of SiGe in order to prevent a polysilicon covering layer from forming over a predetermined region of the SiGe layer forming the transistor base. After an etching process removes the sacrificial mesa and the SiGe layer is exposed, an oppositely doped material is applied over top of the SiGe layer to form an emitter. This makes it possible to realize a thin layer of silicon germanium to serve as the transistor base. This method prevents the base layer SiGe from being affected, as it otherwise would be using a conventional double-poly process.
申请公布号 US6559021(B2) 申请公布日期 2003.05.06
申请号 US20010988537 申请日期 2001.11.20
申请人 SIGE SEMICONDUCTOR INC. 发明人 HOUGHTON DEREK C.;LAFONTAINE HUGUES
分类号 H01L21/331;H01L29/737;(IPC1-7):H01L21/331 主分类号 H01L21/331
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