发明名称 Method and apparatus for optimizing control of a part temperature in conveyorized thermal processor
摘要 A method and apparatus for controlling a part temperature profile by optimizing response characteristics based on control parameters acquires part temperature response characteristics at selected conditions to form an index value and calculates linear relationships between the index and its corresponding control parameters. The method searches for the minimum index thereby determining its corresponding optimal control parameters for thermal processing of parts in order that the part temperature profile responds within the target specification range with the greatest margin available. The apparatus determines the minimum index value and its corresponding the optimum control parameters.
申请公布号 US6560514(B1) 申请公布日期 2003.05.06
申请号 US19990404572 申请日期 1999.09.23
申请人 KIC THERMAL PROFILING 发明人 SCHULTZ STEVEN ARTHUR;KAZMIEROWICZ PHILIP C.
分类号 G05B13/02;(IPC1-7):G05D23/00;G06F19/00 主分类号 G05B13/02
代理机构 代理人
主权项
地址