发明名称 Semiconductor memory device with reduced power consumption and with reduced test time
摘要 A semiconductor memory device includes ferroelectric memory cells, cell transistors connected between first nodes of the memory cells and data transfer lines, the memory cells and the cell transistors being grouped into units each corresponding to one or more column addresses, global word lines, one of which is activated in response to selection of a corresponding row address, global plate lines, one of which is activated in response to selection of the corresponding row address, local word lines, each of which is provided and dedicated for a corresponding one of the units, and is connected to gates of the cell transistors, local plate lines, each of which is provided and dedicated for a corresponding one of the units, and is connected to second nodes of the memory cells, and a unit switch circuit which electrically connects the activated one of the global word lines to one of the local word lines in a selected one of the units so as to achieve the same potential therebetween, and electrically connects the activated one of the global plate lines to one of the local plate lines in the selected one of the units so as to achieve the same potential therebetween.
申请公布号 US6560138(B2) 申请公布日期 2003.05.06
申请号 US20010982768 申请日期 2001.10.22
申请人 FUJITSU LIMITED 发明人 NORO KOUICHI;HIROSHI YOSHIOKA
分类号 G11C11/22;(IPC1-7):G11C11/22 主分类号 G11C11/22
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