发明名称 MOS heterostructure, semiconductor device with the structure, and method for fabricating the semiconductor device
摘要 An MOS heterostructure includes: a single crystal silicon substrate; an insulating film formed on the substrate; and a conductive film formed on the insulating film. The substrate includes a plurality of terraces and steps, which have been formed as a result of rearrangement of silicon atoms on the surface of the substrate. Each of the step is located in a boundary between an adjacent pair of the terraces. The insulating film contains crystalline silicon dioxide that has grown epitaxially over the steps.
申请公布号 US6559518(B1) 申请公布日期 2003.05.06
申请号 US19990404255 申请日期 1999.09.22
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 NIWA MASAAKI
分类号 H01L21/28;H01L29/04;H01L29/10;H01L29/423;H01L29/51;H01L29/94;(IPC1-7):H01L23/58;H01L29/06 主分类号 H01L21/28
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