发明名称 Edge structure for relaxing electric field of semiconductor device having an embedded type diffusion structure
摘要 Plural p+-type regions are formed on a silicon substrate, and thereafter, an n-type epitaxial growth layer is formed. Narrow concave portions are formed to extend between the surface of the epitaxial growth layer 14 and the silicon substrate and to have the almost the same lateral sectional shape. As a result, remaining parts, which are defined by the concave portions, of the epitaxial growth layer on p+-type field limiting rings are separated from the silicon substrate. Thus, a depletion layer is spread beyond the field limiting rings and a large forward voltage-resistance can be realized.
申请公布号 US6558996(B1) 申请公布日期 2003.05.06
申请号 US20000691016 申请日期 2000.10.18
申请人 NGK INSULATORS, INC. 发明人 SHIMIZU NAOHIRO
分类号 H01L29/74;H01L21/332;H01L29/06;H01L29/739;(IPC1-7):H01L21/337 主分类号 H01L29/74
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