发明名称 METHOD OF FORMING INTERCONNECTS
摘要 A method of forming interconnects. An oxide masking layer with patterns is formed overlaying the metal layer. The patterns of the masking layer are transferred into the metal layer so as to form an opening. Then, a silicon nitride liner is conformally formed on the masking layer, the metal layer and the first insulating layer. Next, the silicon nitride liner and the masking layer are partially removed by reactive ion etching to leave a facet mask to reduce the aspect ratio of the opening followed by removal of the remaining silicon nitride liner. Then, an insulating layer is deposited to fill the opening.
申请公布号 US2003082899(A1) 申请公布日期 2003.05.01
申请号 US20020057085 申请日期 2002.01.25
申请人 NANYA TECHNOLOGY CORPORATION 发明人 HUANG TSE-YAO;LIN CHIH-CHING;SUN YU-CHI;WU CHANG RONG;SHIH SHING-YIH
分类号 H01L21/768;(IPC1-7):H01L21/476 主分类号 H01L21/768
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