发明名称 Methods and apparatus for analyzing waveguide couplers
摘要 Methods for analyzing waveguide couplers are non-destructive, and comprise introducing probe light into a coupler; providing a source of perturbing radiation; presenting the coupling region of the coupler to the perturbing radiation to generate a temperature gradient across the waveguide, either from a direction so as to expose one waveguide before another waveguide and perturb the coupling region asymmetrically, or from a direction so as to expose the waveguides together and perturb the coupling region symmetrically; monitoring the power and/or phase of transmitted probe light, and repeating the presenting and monitoring along the length of the coupling region. Theoretical modeling shows that the transmitted probe light contains information from which can be derived the coupling profile, and power evolution and distribution along the coupling region, including location of the 50-50% points.
申请公布号 US2003081881(A1) 申请公布日期 2003.05.01
申请号 US20020216890 申请日期 2002.08.13
申请人 ALEGRIA CARLOS;ZERVAS MIKHAIL NICKOLAOS 发明人 ALEGRIA CARLOS;ZERVAS MIKHAIL NICKOLAOS
分类号 G01M11/00;(IPC1-7):G02B6/26 主分类号 G01M11/00
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