发明名称 LIQUID CRYSTAL PROCESS DEFECT INSPECTION APPARATUS AND INSPECTION METHOD
摘要 The glass substrate test apparatus of the liquid crystal cell process comprises a laser unit for generating a laser beam, a beam slitter and parallel beam slitter for slitting the laser beam emitted from the laser unit so as to have an elongated cross section and parallelizing the slit laser beam, a photo detector for detecting an intensity of double refraction of the slit laser beam transmitted over the whole glass substrate, a phase detector for measuring the laser double refraction detected by the photo detector and comparing the measured double refraction with a standard laser double refraction, and a polarizer arranged between the laser unit and the beam slitter or between the beam slitter and the parallel beam slitter for polarizing the laser beam to a parallel ray.
申请公布号 WO03036274(A1) 申请公布日期 2003.05.01
申请号 WO2002KR00738 申请日期 2002.04.22
申请人 SAMSUNG ELECTRONICS CO., LTD.;CHOO, DAE-HO;WON, MIN-YOUNG;NAM, HYOO-HAK;JEON, BAEK-KEUN 发明人 CHOO, DAE-HO;WON, MIN-YOUNG;NAM, HYOO-HAK;JEON, BAEK-KEUN
分类号 G02F1/13;G01N21/23;G01N21/896;G01N21/958 主分类号 G02F1/13
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