发明名称 |
MEMORY CELL WITH VERTICAL FLOATING GATE TRANSISTOR |
摘要 |
A semiconductor device (8) includes a substrate (10) having a trench (18) formed therein. A gate structure for a vertical transistor is formed adjacent to a sidewall of the trench. The gate structure includes a floating gate conductor (52) formed in contact with sidewalls of the trench. The floating gate forms a void in a center portion of the floating gate conductor, and the center portion has vertically disposed surfaces. A dielectric layer (46) lines the void in the center portion of the floating gate conductor, and a control gate (48) conductor is formed in contact with the dielectric layer. The control gate conductor fills the void in the center portion of the floating gate conductor. Methods for fabricating the semiconductor device are also disclosed. |
申请公布号 |
WO0245158(A3) |
申请公布日期 |
2003.05.01 |
申请号 |
WO2001US43903 |
申请日期 |
2001.11.14 |
申请人 |
INFINEON TECHNOLOGIES NORTH AMERICA CORP. |
发明人 |
CASAROTTO, DANIELE |
分类号 |
H01L21/336;H01L21/8247;H01L27/115;H01L29/423;H01L29/788 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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