发明名称 MEMORY CELL WITH VERTICAL FLOATING GATE TRANSISTOR
摘要 A semiconductor device (8) includes a substrate (10) having a trench (18) formed therein. A gate structure for a vertical transistor is formed adjacent to a sidewall of the trench. The gate structure includes a floating gate conductor (52) formed in contact with sidewalls of the trench. The floating gate forms a void in a center portion of the floating gate conductor, and the center portion has vertically disposed surfaces. A dielectric layer (46) lines the void in the center portion of the floating gate conductor, and a control gate (48) conductor is formed in contact with the dielectric layer. The control gate conductor fills the void in the center portion of the floating gate conductor. Methods for fabricating the semiconductor device are also disclosed.
申请公布号 WO0245158(A3) 申请公布日期 2003.05.01
申请号 WO2001US43903 申请日期 2001.11.14
申请人 INFINEON TECHNOLOGIES NORTH AMERICA CORP. 发明人 CASAROTTO, DANIELE
分类号 H01L21/336;H01L21/8247;H01L27/115;H01L29/423;H01L29/788 主分类号 H01L21/336
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