发明名称 Method of fabricating nitride semiconductor and method of fabricating semiconductor device
摘要 A method of fabricating a nitride semiconductor includes the steps of forming a nitride semiconductor doped with a p-type impurity, treating the surface of the nitride semiconductor in an atmosphere containing active oxygen to remove carbon remaining the surface and form an oxide film thereon, and activating the p-type impurity to turn the conductive type of the nitride semiconductor into a p-type. Since carbon remaining on the surface of the nitride semiconductor is removed and the oxide film is formed thereon, the surface of the nitride semiconductor is prevented from being deteriorated by the activating treatment and the rate of activating the p-type impurity is enhanced. As a result, it is possible to reduce the contact resistance of the nitride semiconductor with an electrode and hence to variation in characteristics of the nitride semiconductor.
申请公布号 US2003082893(A1) 申请公布日期 2003.05.01
申请号 US20020184902 申请日期 2002.07.01
申请人 MATSUMOTO OSAMU;ANSAI SHINICHI;KIJIMA SATORU 发明人 MATSUMOTO OSAMU;ANSAI SHINICHI;KIJIMA SATORU
分类号 H01L29/43;C30B33/00;H01L21/28;H01L21/285;H01L21/316;H01L21/324;H01S5/042;H01S5/323;(IPC1-7):H01L21/00;C30B23/00 主分类号 H01L29/43
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