发明名称 In-circuit test adapter for printed circuit board testing uses direct contact sleeves for direct connections between tested printed circuit board an in-circuit testing system
摘要 The in-circuit test adapter has the contact connections between the tested printed circuit board and the in-circuit testing system provided via direct contact sleeves, each having a sleeve for reception of a test spring contact and an interchangeable contact part, selected in dependence on the required contact length.
申请公布号 DE10147510(A1) 申请公布日期 2003.04.30
申请号 DE2001147510 申请日期 2001.09.26
申请人 BOCTOR, GRANT;RATZKY, BRUNO 发明人 BOCTOR, GRANT;RATZKY, BRUNO
分类号 G01R1/073;H01R11/18;(IPC1-7):G01R31/28 主分类号 G01R1/073
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