发明名称 |
Measurement of grooves and long waves on rails with a longitudinal streak of light |
摘要 |
A system for measuring unevenness formed by grooves and/or long waves in a surface of an object by using a measuring platform. The system moves the object and the measuring platform relative to each other and projects from the measuring platform a light streak that extends in a direction of the movement onto a surface of the object at a fixed projection angle that is tilted relative to a surface normal of the surface. The light streak is reproduced on a planar, position-sensitive photo receiver with a plurality of successive instantaneous exposures of the photo receiver, where the photo receiver is fixedly arranged on the measuring platform with a recording angle that is tilted relative to the fixed projection angle. The system records the surface along the direction of the movement with a plurality of continuous light-streak images and determines a surface profile of the surface along the direction of the movement from deformations in the plurality of the light-streak images.
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申请公布号 |
US6556945(B1) |
申请公布日期 |
2003.04.29 |
申请号 |
US20000424543 |
申请日期 |
2000.03.07 |
申请人 |
STN ATLAS ELEKTRONIK GMBH |
发明人 |
BURGGRAF HUBERT;KETTENBURG ROLF;KRUPP ANDREAS;MAIWALD DIRK;RATHJEN DIRK |
分类号 |
E01B35/00;G01B11/24;G01B11/30;G01C3/06;G01N21/89;(IPC1-7):G01B11/02 |
主分类号 |
E01B35/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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