发明名称 Method and apparatus for inspecting bumps and determining height from a regular reflection region
摘要 A method of inspecting bumps provided on a surface of an object to be inspected includes the steps of: (a) irradiating a first irradiation beam on said object in an oblique direction and (b) imaging a first reflected beam from said object so as to obtain a first reflection image including a first reflection region and a height data of said bump corresponding to said first regular reflection region produced by a part of the first reflected beam reflected near an apex of the bump. The method further includes the steps of (c) shifting a position of said first regular reflection region in said first reflection image in accordance with a value derived from said height data and said predetermined angle, (d) extracting said first regular reflection region within a predetermined region from said first reflection image after said step c), and (e) detecting a height of said bump based on said height data corresponding to the extracted first regular reflection region. Also disclosed is an apparatus for performing the disclosed method.
申请公布号 US6555836(B1) 申请公布日期 2003.04.29
申请号 US20000533235 申请日期 2000.03.22
申请人 FUJITSU LIMITED 发明人 TAKAHASHI FUMIYUKI;TSUKAHARA HIROYUKI;OSHIMA YOSHITAKA;NISHIYAMA YOUJI;FUSE TAKASHI
分类号 G01B11/24;G01N21/956;H01L21/60;(IPC1-7):G01N21/86 主分类号 G01B11/24
代理机构 代理人
主权项
地址