发明名称 REMOVING AGENT COMPOSITION
摘要 PROBLEM TO BE SOLVED: To provide a removing agent composition which hardly corrodes a silicon part even when a photoresist or a residual material depositing on the surface of a semiconductor device where both of the silicon part and a metal oxide film are exposed on the surface is to be removed. SOLUTION: The removing agent composition is characterized in containing an inorganic acid and/or its salt and a fluoroalkylacrylate copolymer. A method for removing a photoresist is presented featuring that the above removing agent composition is used to remove a photoresist. A method for removing a residual material of a semiconductor device is also presented featuring that the above removing agent composition is used to remove the residual material produced in the treatment of a semiconductor.
申请公布号 JP2003122027(A) 申请公布日期 2003.04.25
申请号 JP20010317987 申请日期 2001.10.16
申请人 SUMITOMO CHEM CO LTD 发明人 ICHIKI NAOKI
分类号 G03F7/42;C08K3/24;C08K3/32;C08L33/16;C09D9/00;H01L21/027;(IPC1-7):G03F7/42 主分类号 G03F7/42
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