发明名称 |
REMOVING AGENT COMPOSITION |
摘要 |
PROBLEM TO BE SOLVED: To provide a removing agent composition which hardly corrodes a silicon part even when a photoresist or a residual material depositing on the surface of a semiconductor device where both of the silicon part and a metal oxide film are exposed on the surface is to be removed. SOLUTION: The removing agent composition is characterized in containing an inorganic acid and/or its salt and a fluoroalkylacrylate copolymer. A method for removing a photoresist is presented featuring that the above removing agent composition is used to remove a photoresist. A method for removing a residual material of a semiconductor device is also presented featuring that the above removing agent composition is used to remove the residual material produced in the treatment of a semiconductor. |
申请公布号 |
JP2003122027(A) |
申请公布日期 |
2003.04.25 |
申请号 |
JP20010317987 |
申请日期 |
2001.10.16 |
申请人 |
SUMITOMO CHEM CO LTD |
发明人 |
ICHIKI NAOKI |
分类号 |
G03F7/42;C08K3/24;C08K3/32;C08L33/16;C09D9/00;H01L21/027;(IPC1-7):G03F7/42 |
主分类号 |
G03F7/42 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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