发明名称 METHOD OF READING STORED DATA AND SEMICONDUCTOR MEMORY
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor memory in which reduction of a static noise margin accompanying voltage drop of power source voltage can be suppressed and the degree of integration of a circuit can be improved, and its method of reading stored data. SOLUTION: Matrix cells MC11-MCmk are four transistors type SRAM cells in which a load transistor of an inverter in a storage circuit is omitted. In a holding period of stored data, each pair of bit line (bj, bjB) is made pull-up to power source voltage by a bit line voltage control section 4, but a static noise margin at read-out is improved by boosting this pull-up voltage to higher voltage than power source voltage in reading stored data. The degree of integration of a circuit in a CAM can be improved by applying this four transistors type SRAM to a CAM.
申请公布号 JP2003123482(A) 申请公布日期 2003.04.25
申请号 JP20020046046 申请日期 2002.02.22
申请人 SONY CORP 发明人 KASAI GEN;FURUMI KOJI
分类号 G11C11/418;G11C7/22;G11C11/41;G11C11/412;G11C11/419;G11C15/04;H01L21/8244;H01L27/11 主分类号 G11C11/418
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