| 摘要 |
PROBLEM TO BE SOLVED: To measure the leak current of a capacitor element accurately without being ristricted by the breakdown voltage of a semiconductor element connected in parallel with the capacitor element. SOLUTION: Capacitor elements 6 and 7 are connected in series and an inspection terminal 8 is provided at the connecting point. Furthermore, a field effect transistor 4 is connected in parallel with the capacitor elements 6 and 7. A DC voltage of 10 V or above is applied between the inspection terminal 8 and a Vs terminal 1 and between the terminal 8 and a Vd terminal 2, and then leak currents of the capacitor elements 6 and 7 are measured. A determination can be made whether the capacitor element is faulty or not.
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