发明名称 SEMICONDUCTOR ELEMENT, EPITAXIAL SUBSTRATE, METHOD OF MANUFACTURING SEMICONDUCTOR ELEMENT, AND METHOD OF MANUFACTURING EPITAXIAL SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor element that is improved in crystal quality by the reducing dislocation density and to provide an epitaxial substrate used for the element. SOLUTION: On a base material 11 composed of a single-crystal material, a foundation layer 12 composed of an Al-containing III nitride is formed. Then a mask 14 is formed on the foundation layer 12 in a pattern-like form and an initial epitaxially-grown layer 16 having facets 15 and composed of a III nitride is formed through the mask 14. Thereafter, an intermediate layer 13 having the facets 15 is formed by again epitaxially growing the III nitride so that the nitride may bury the initial epitaxially grown layer 16 and may have a flat surface.
申请公布号 JP2003124124(A) 申请公布日期 2003.04.25
申请号 JP20010314768 申请日期 2001.10.12
申请人 NGK INSULATORS LTD 发明人 SHIBATA TOMOHIKO;TANAKA MITSUHIRO;HIRAMATSU KAZUMASA;MIYAKE HIDETO;KIDA YOSHIHIRO
分类号 C30B29/38;H01L21/205;(IPC1-7):H01L21/205 主分类号 C30B29/38
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