发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To solve the problem that a solving means to improve ON resistance caused by the take-out resistance of a source electrode for a mostly affected MOSFET chip can not be found since the take-out of the electrode on the upper surface of the MOSFET chip depends on a wire bonding. SOLUTION: Low ON-resistance is obtained by excluding the leading-around of common drain electrodes and fixing a source electrode directly to a conductive passage through a protective circuit device employing the MOSFET chip, made by integrating a plurality of conductive passages separated electrically and two pieces of power MOSFETs, in which a gate electrode and the source electrode are fixed on a desired conductive passage into one chip, a conductive material provided on the common drain electrode of the MOSFET chip and an insulating resin for covering the MOSFET chip and supporting the conductive passage integrally.
申请公布号 JP2003124260(A) 申请公布日期 2003.04.25
申请号 JP20020254574 申请日期 2002.08.30
申请人 SANYO ELECTRIC CO LTD 发明人 SAKAMOTO NORIAKI;KOBAYASHI YOSHIYUKI;FUKUDA HIROKAZU;ETO HIROKI;TAKAHASHI YUKITSUGU
分类号 H01L21/60;H01L21/56 主分类号 H01L21/60
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