发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To suppress a capacitive component between a wiring layer and a ground potential layer and to secure isolation above and under the ground potential layer in re-wiring a semiconductor device. SOLUTION: A first insulating layer 5 is provided between a silicon board 1 as a semiconductor board formed with circuit elements and a first wiring layer 11 of the ground potential layer, an insulating layer 7 is provided between the first wiring layer 11 and a second wiring layer 12, and the distance between diagonals of a hole provided in the form of grid on the ground potential layer is made <=1/8 wavelength. Therefore, isolation can be secured above and under the ground potential layer, and the capacitive component between layers can be suppressed. Thus, the isolation can be secured and a floating capacity can be suppressed without limiting a layout in re-wiring.
申请公布号 JP2003124394(A) 申请公布日期 2003.04.25
申请号 JP20010320169 申请日期 2001.10.18
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 ASAKAWA YASUTERU;TSUNEOKA MICHIO;ANPO TAKEO
分类号 H01L21/768;H01L21/3205;H01L23/12;H01L23/52;H01L23/522;(IPC1-7):H01L23/12;H01L21/320 主分类号 H01L21/768
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