发明名称 Method of automatic layout design for LSI, mask set and semiconductor integrated circuit manufactured by automatic layout design method, and recording medium storing automatic layout design program
摘要 With an automatic layout method, a first line having a first line width is generated in a prescribed direction. A second line having a second line width and extending at an oblique angle with respect to the first line is generated, so that the second line terminates at an end portion of the first line with an overlapped area. One or more VIA patterns are read out of a database according to the shape of the overlapped area. The VIA patterns are placed in the overlapped area, so that one of the VIA patterns is located at the intersection of the center lines of the first and second lines. The VIA pattern is a combination of parallelograms, including squares and rectangles.
申请公布号 US2003079194(A1) 申请公布日期 2003.04.24
申请号 US20020279403 申请日期 2002.10.24
申请人 IGARASHI MUTSUNORI;MURAKATA MASAMI;MITSUHASHI TAKASHI;YAMADA MASAAKI;MINAMI FUMIHIRO;ISHIOKA TAKASHI 发明人 IGARASHI MUTSUNORI;MURAKATA MASAMI;MITSUHASHI TAKASHI;YAMADA MASAAKI;MINAMI FUMIHIRO;ISHIOKA TAKASHI
分类号 H01L21/82;G03F1/08;G03F1/68;G03F1/70;G06F1/10;G06F17/50;H01L23/528;H01L27/04;(IPC1-7):G06F17/50 主分类号 H01L21/82
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